TEM study of the structure of gallium nitride epitaxial...

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 2007 / 06 Vol. 1; Iss. 3

TEM study of the structure of gallium nitride epitaxial films grown on substrates with different interface morphologies

A. A. Sitnikova, S. G. Konnikov, D. A. Kirilenko, M. G. Mynbaeva, M. A. Odnoblyudov, V. E. Bugrov, T. Lang
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Volume:
1
Language:
english
Pages:
4
DOI:
10.1134/s102745100703007x
Date:
June, 2007
File:
PDF, 426 KB
english, 2007
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