Phase composition diagnostics of surfaces, thin films, and...

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 2008 Vol. 2; Iss. 1

Phase composition diagnostics of surfaces, thin films, and interfaces by Auger electron spectroscopy

V. G. Beshenkov, A. F. Vyatkin, A. G. Znamenskii, V. A. Marchenko
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Volume:
2
Year:
2008
Language:
english
Pages:
1
DOI:
10.1134/s1027451008010047
File:
PDF, 214 KB
english, 2008
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