X-ray photoelectron and auger spectroscopy analysis of...

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 2008 / 08 Vol. 2; Iss. 4

X-ray photoelectron and auger spectroscopy analysis of Ge:Mn-based magnetic semiconductor layers

E. S. Demidov, S. Yu. Zubkov, V. P. Lesnikov, G. A. Maksimov, D. E. Nikolichev, V. V. Podol’skii
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Volume:
2
Language:
english
Pages:
5
DOI:
10.1134/s1027451008040083
Date:
August, 2008
File:
PDF, 194 KB
english, 2008
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