Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2009 / 06 Vol. 3; Iss. 3
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Determination of atomic pair correlation functions for nickel oxide films via extended energy-loss fine structure spectroscopy
O. R. Bakieva, D. E. Gai, A. N. Deev, F. Z. Gil’mutdinovVolume:
3
Language:
english
Pages:
7
DOI:
10.1134/s1027451009030045
Date:
June, 2009
File:
PDF, 273 KB
english, 2009