Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2009 / 06 Vol. 3; Iss. 3
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Use of the projective method for determining statistical characteristics of the solution to the differential diffusion equation of minority carriers generated in a semiconductor material by a wide electron beam
E. V. Seregina, A. M. Makarenkov, M. A. StepovichVolume:
3
Language:
english
Pages:
15
DOI:
10.1134/s1027451009030239
Date:
June, 2009
File:
PDF, 404 KB
english, 2009