Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2009 / 10 Vol. 3; Iss. 5
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On applicability of confluence analysis in cathodoluminescence microscopy for interval estimation of diffusion lengths of minority carriers and depths of subsurface regions with depletion of majority carriers
N. N. Mikheev, A. N. Polyakov, M. A. StepovichVolume:
3
Language:
english
Pages:
6
DOI:
10.1134/s1027451009050267
Date:
October, 2009
File:
PDF, 240 KB
english, 2009