Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2010 / 02 Vol. 4; Iss. 1
Preliminary characterization of semiconductor detectors in the soft X-ray range using synchrotron radiation from the VEPP-4 storage ring
P. N. Aruev, Yu. M. Kolokolnikov, N. V. Kovalenko, A. A. Legkodymov, V. V. Lyakh, A. D. Nikolenko, V. F. Pindyurin, V. L. Sukhanov, V. V. ZabrodskyVolume:
4
Language:
english
Pages:
5
DOI:
10.1134/s1027451010010167
Date:
February, 2010
File:
PDF, 270 KB
english, 2010