Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2010 / 06 Vol. 4; Iss. 3
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Features of atomic and electronic structure of oxides on porous silicon surface according to XANES data
E. P. Domashevskaya, V. A. Terekhov, S. Yu. Turishchev, D. A. Khoviv, V. A. Skryshevskii, I. V. Gavril’chenkoVolume:
4
Language:
english
Pages:
6
DOI:
10.1134/s1027451010030055
Date:
June, 2010
File:
PDF, 193 KB
english, 2010