Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2010 / 10 Vol. 4; Iss. 5
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Comparison of extended-defect contrasts calculated in the XBIC and EBIC methods
E. B. YakimovVolume:
4
Language:
english
Pages:
3
DOI:
10.1134/s1027451010050022
Date:
October, 2010
File:
PDF, 136 KB
english, 2010