Scanning helium ion microscope: Distribution of secondary...

Scanning helium ion microscope: Distribution of secondary electrons and ion channeling

Yu. V. Petrov, O. F. Vyvenko, A. S. Bondarenko
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Volume:
4
Language:
english
Pages:
4
DOI:
10.1134/s1027451010050186
Date:
October, 2010
File:
PDF, 135 KB
english, 2010
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