Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2010 / 10 Vol. 4; Iss. 5
![](/img/cover-not-exists.png)
Scanning helium ion microscope: Distribution of secondary electrons and ion channeling
Yu. V. Petrov, O. F. Vyvenko, A. S. BondarenkoVolume:
4
Language:
english
Pages:
4
DOI:
10.1134/s1027451010050186
Date:
October, 2010
File:
PDF, 135 KB
english, 2010