Analysis of depth profiles of hydrogen isotopes in...

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques 2011 / 02 Vol. 5; Iss. 1

Analysis of depth profiles of hydrogen isotopes in structural materials via reflected electron spectroscopy

V. P. Afanas’ev, M. V. Afanas’ev, A. A. Batrakov, W. Bohmeyer, D. Naujoks, A. V. Lubenchenko, A. Markin
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Volume:
5
Language:
english
Pages:
5
DOI:
10.1134/s1027451011010034
Date:
February, 2011
File:
PDF, 328 KB
english, 2011
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