Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2011 / 08 Vol. 5; Iss. 4
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AlGaN/GaN heterostructure study using Rutherford backscattering spectrometry
K. L. Enisherlova, V. S. Kulikauskas, V. V. Zatekin, T. F. Rusak, N. B. Gladysheva, I. I. RazgulyaevVolume:
5
Language:
english
Pages:
10
DOI:
10.1134/s1027451011070093
Date:
August, 2011
File:
PDF, 1.07 MB
english, 2011