Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2011 / 12 Vol. 5; Iss. 6
Investigation of the structure and internal stresses in transition layers of nickel-based films
T. A. Tochitskii, A. E. DmitrievaVolume:
5
Language:
english
Pages:
4
DOI:
10.1134/s1027451011080131
Date:
December, 2011
File:
PDF, 1.08 MB
english, 2011