Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2011 / 10 Vol. 5; Iss. 5
Synchrotron investigations of electronic and atomic-structure peculiarities for silicon-oxide films’ surface layers containing silicon nanocrystals
V. A. Terekhov, S. Yu. Turishchev, K. N. Pankov, I. E. Zanin, E. P. Domashevskaya, D. I. Tetelbaum, A. N. Mikhailov, A. I. Belov, D. E. NikolichevVolume:
5
Language:
english
Pages:
10
DOI:
10.1134/s102745101110020x
Date:
October, 2011
File:
PDF, 351 KB
english, 2011