Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2012 / 02 Vol. 6; Iss. 1
New method for determining the thermal diffusion coefficient of thin films using ferroelectric crystals
A. A. Movchikova, O. V. Malyshkina, O. N. KaluginaVolume:
6
Language:
english
Pages:
4
DOI:
10.1134/s102745101201017x
Date:
February, 2012
File:
PDF, 223 KB
english, 2012