A method for grouping thyristors according to reliability using low-frequency noise and X-ray radiation
M. I. Gorlov, D. Yu. Smirnov, E. A. ZolotarevaVolume:
46
Language:
english
Pages:
3
DOI:
10.1134/s1061830910120028
Date:
December, 2010
File:
PDF, 134 KB
english, 2010