![](/img/cover-not-exists.png)
Dependence of the reliability of discharge radiation sources on the structural perfection of sapphire envelopes
S. V. GavrishVolume:
46
Language:
english
Pages:
7
DOI:
10.1134/s1061830910120077
Date:
December, 2010
File:
PDF, 211 KB
english, 2010