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X-ray or UV adjustment of MOS threshold voltage: Analytical and numerical modeling
M. N. Levin, A. V. Tatarintsev, V. A. Makarenko, V. R. GitlinVolume:
35
Language:
english
Pages:
8
DOI:
10.1134/s1063739706050088
Date:
September, 2006
File:
PDF, 210 KB
english, 2006