Transistor-degradation prediction by time-series analysis

Russian Microelectronics 2006 / 09-10 Vol. 35; Iss. 5

Transistor-degradation prediction by time-series analysis

M. I. Gorlov, A. V. Strogonov, D. Yu. Smirnov
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Volume:
35
Language:
english
Pages:
8
DOI:
10.1134/s106373970605009x
Date:
September, 2006
File:
PDF, 183 KB
english, 2006
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