The use of the photorefractive effect for comprehensive three-dimensional local measurements of electrical and thermal parameters of silicon structures
A. L. Filatov, A. V. LugovskoĭVolume:
42
Language:
english
Pages:
4
DOI:
10.1134/s1063782608130253
Date:
December, 2008
File:
PDF, 207 KB
english, 2008