The use of the photorefractive effect for comprehensive...

The use of the photorefractive effect for comprehensive three-dimensional local measurements of electrical and thermal parameters of silicon structures

A. L. Filatov, A. V. Lugovskoĭ
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Volume:
42
Language:
english
Pages:
4
DOI:
10.1134/s1063782608130253
Date:
December, 2008
File:
PDF, 207 KB
english, 2008
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