High-resolution X-ray diffraction studies of the GaAs...

Semiconductors 2009 / 08 Vol. 43; Iss. 8

High-resolution X-ray diffraction studies of the GaAs structures grown at a low temperature and periodically δ-doped with antimony and phosphorus

V. V. Chaldyshev, M. A. Yagovkina, M. V. Baidakova, V. V. Preobrazhenskii, M. A. Putyato, B. R. Semyagin
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
43
Language:
english
Pages:
8
DOI:
10.1134/s1063782609080211
Date:
August, 2009
File:
PDF, 265 KB
english, 2009
Conversion to is in progress
Conversion to is failed