X-ray diffraction analysis and scanning micro-Raman...

X-ray diffraction analysis and scanning micro-Raman spectroscopy of structural irregularities and strains deep inside the multilayered InGaN/GaN heterostructure

V. V. Strelchuk, V. P. Kladko, E. A. Avramenko, O. F. Kolomys, N. V. Safryuk, R. V. Konakova, B. S. Yavich, M. Ya. Valakh, V. F. Machulin, A. E. Belyaev
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Volume:
44
Language:
english
Pages:
12
DOI:
10.1134/s1063782610090174
Date:
September, 2010
File:
PDF, 386 KB
english, 2010
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