![](/img/cover-not-exists.png)
The effect of Sn impurity on the optical and structural properties of thin silicon films
V. V. Voitovych, V. B. Neimash, N. N. Krasko, A. G. Kolosiuk, V. Yu. Povarchuk, R. M. Rudenko, V. A. Makara, R. V. Petrunya, V. O. Juhimchuk, V. V. StrelchukVolume:
45
Language:
english
Pages:
5
DOI:
10.1134/s1063782611100253
Date:
October, 2011
File:
PDF, 236 KB
english, 2011