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The effect of high iron-ion implantation doses on the X-ray emission spectra of silicon
D. A. Zatsepin, E. S. Yanenkova, É. Z. Kurmaev, V. M. Cherkashenko, S. N. Shamin, S. O. CholakhVolume:
48
Language:
english
Pages:
6
DOI:
10.1134/s1063783406020041
Date:
February, 2006
File:
PDF, 224 KB
english, 2006