Investigation of the hemoglobin adsorption in porous...

Technical Physics 2011 / 07 Vol. 56; Iss. 7

Investigation of the hemoglobin adsorption in porous silicon by the ellipsometry method

V. V. Bolotov, N. A. Davletkil’deev, A. A. Korotenko, E. Yu. Mosur, O. Yu. Proskurina, Yu. A. Sten’kin
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Volume:
56
Language:
english
Pages:
3
DOI:
10.1134/s106378421107005x
Date:
July, 2011
File:
PDF, 284 KB
english, 2011
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