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Relative x-ray reflectometry of discrete layered structures
A. G. Tur’yanskiĭ, S. A. Aprelov, N. N. Gerasimenko, I. V. Pirshin, V. M. SenkovVolume:
33
Language:
english
Pages:
4
DOI:
10.1134/s1063785007030121
Date:
March, 2007
File:
PDF, 230 KB
english, 2007