Reflection electron-energy-loss spectroscopy of FexSi1 −xthin films
A. S. Parshin, G. A. Alexandrova, A. E. Dolbak, O. P. Pchelyakov, B. Z. Ol’shanetskiĭ, S. G. Ovchinnikov, S. A. KushchenkovVolume:
34
Language:
english
Pages:
3
DOI:
10.1134/s1063785008050064
Date:
May, 2008
File:
PDF, 219 KB
english, 2008