Johann crystal diffraction spectrometer for measuring small chemical shifts of soft X-ray lines
A. A. Petrunin, A. E. Sovestnov, A. V. Tyunis, É. V. FominVolume:
35
Language:
english
Pages:
3
DOI:
10.1134/s1063785009010222
Date:
January, 2009
File:
PDF, 184 KB
english, 2009