Studying electric field profiles in GaAs-based detector structures by Kelvin probe force microscopy
M. D. Vilisova, V. P. Germogenov, O. Zh. Kaztaev, V. A. Novikov, I. V. Ponomarev, A. N. TitkovVolume:
36
Language:
english
Pages:
3
DOI:
10.1134/s1063785010050147
Date:
May, 2010
File:
PDF, 170 KB
english, 2010