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Electron irradiation controlled profile of recombination center concentration in silicon
I. V. Grekhov, L. S. Kostina, V. V. Kozlovskii, V. N. Lomasov, A. V. RozhkovVolume:
37
Language:
english
Pages:
3
DOI:
10.1134/s1063785011050075
Date:
May, 2011
File:
PDF, 151 KB
english, 2011