Statistical features of the avalanche multiplication...

Journal of Communications Technology and Electronics 2009 / 11 Vol. 54; Iss. 11

Statistical features of the avalanche multiplication build-up in semiconductors with different coefficients of impact ionization

A. V. Verkhovtseva, I. V. Vanyushin, V. A. Gergel’, A. P. Zelenyi, V. A. Zimoglyad, Yu. I. Tishin
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Volume:
54
Language:
english
Pages:
6
DOI:
10.1134/s1064226909110151
Date:
November, 2009
File:
PDF, 238 KB
english, 2009
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