A temperature-deformation unit for scanning electron probe...

Polymer Science Series B 2007 / 12 Vol. 49; Iss. 11-12

A temperature-deformation unit for scanning electron probe microscopy of polymers

A. V. Kraev, S. A. Saunin, M. E. Alekseev, V. A. Safonov, R. V. Talrose
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Volume:
49
Language:
english
Pages:
6
DOI:
10.1134/s1560090407110048
Date:
December, 2007
File:
PDF, 665 KB
english, 2007
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