![](/img/cover-not-exists.png)
Testing and correction of optical elements with subnanometer precision
E. B. Kluyenkov, A. E. Pestov, V. N. Polkovnikov, D. G. Raskin, M. N. Toporov, N. N. Salashchenko, N. I. ChkhaloVolume:
3
Language:
english
Pages:
9
DOI:
10.1134/s1995078008090103
Date:
October, 2008
File:
PDF, 465 KB
english, 2008