Enhanced sensitivity and selectivity of a gas...

Enhanced sensitivity and selectivity of a gas chromatography–microwave-induced plasma atomic emission system (GC-MIP) at the 685.6-nm fluorine emission line

Fabio Augusto, Antonio Luiz Pires Valente
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Volume:
11
Year:
1999
Language:
english
Pages:
5
DOI:
10.1002/(sici)1520-667x(1999)11:13.0.co;2-f
File:
PDF, 103 KB
english, 1999
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