Determination of thin film refractive index and thickness...

Central European Journal of Physics 2008 / 06 Vol. 6; Iss. 2

Determination of thin film refractive index and thickness by means of film phase thickness

Milen R. Nenkov, Tamara G. Pencheva
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Volume:
6
Language:
english
Pages:
12
DOI:
10.2478/s11534-008-0035-z
Date:
June, 2008
File:
PDF, 675 KB
english, 2008
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