Application of high-resolution electron microscopy for...

Application of high-resolution electron microscopy for visualization and quantitative analysis of strain fields in heterostructures

A. K. Gutakovskii, A. L. Chuvilin, S. A. Song
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Volume:
71
Language:
english
Pages:
7
DOI:
10.3103/s1062873807100267
Date:
October, 2007
File:
PDF, 320 KB
english, 2007
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