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An X-ray fluorescence depth distribution function for electron beam microanalysis
N. N. Mikheev, M. A. Stepovich, E. V. ShirokovaVolume:
74
Language:
english
Pages:
5
DOI:
10.3103/s1062873810070245
Date:
July, 2010
File:
PDF, 228 KB
english, 2010