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Investigation of profiles of the distribution of ion-implanted Mn atoms using the rutherford back scattering method and the influence of thermal annealing on them
B. E. Egamberdiev, B. Ch. Kholliev, A. S. MallaevVolume:
43
Language:
english
Pages:
3
DOI:
10.3103/s1068375507020147
Date:
April, 2007
File:
PDF, 142 KB
english, 2007