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Dual processes in recognition: Does a focus on measurement operations provide a sufficient foundation?
Michael S. Humphreys, Simon Dennis, Kerry A. Chalmers, Simon FinniganVolume:
7
Language:
english
Pages:
11
DOI:
10.3758/bf03212997
Date:
December, 2000
File:
PDF, 1.28 MB
english, 2000