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Examining the relationship between free recall and immediate serial recall: The serial nature of recall and the effect of test expectancy
Parveen Bhatarah, Geoff Ward, Lydia TanVolume:
36
Language:
english
Pages:
15
DOI:
10.3758/mc.36.1.20
Date:
January, 2008
File:
PDF, 526 KB
english, 2008