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Defect-induced microstructures: an X-ray diffraction analysis
J. Chrosch, M. Colombo, I. Memmi, R. BiaginiVolume:
34
Language:
english
Pages:
5
DOI:
10.1023/a:1004517422465
Date:
May, 1999
File:
PDF, 117 KB
english, 1999