Frequency Dependence of a Cryogenic Capacitor Measured...

Journal of Low Temperature Physics 2000 / 03 Vol. 118; Iss. 5-6

Frequency Dependence of a Cryogenic Capacitor Measured Using Single Electron Tunneling Devices

Ali L. Eichenberger, Mark W. Keller, John M. Martinis, Neil M. Zimmerman
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Volume:
118
Pages:
8
DOI:
10.1023/a:1004681615013
Date:
March, 2000
File:
PDF, 327 KB
2000
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