Accuracy of energy dispersive x-ray composition analysis of YBCO films on yttrium-containing substrates as compared to Rutherford backscattering spectroscopy
Z. Mustapha, Siu-Wai Chan, A. Lam, R. GerhardtVolume:
35
Language:
english
Pages:
6
DOI:
10.1023/a:1004723519096
Date:
January, 2000
File:
PDF, 65 KB
english, 2000