The Use of High-Energy Synchrotron Diffraction for Residual...

Journal of Materials Science Letters 1999 / 04 Vol. 18; Iss. 7

The Use of High-Energy Synchrotron Diffraction for Residual Stress Analyses

W. Reimers, A. Pyzalla, M. Broda, G. Brusch, D. Dantz, T. Schmackers, K.-D. Liss, T. Tschentscher
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Volume:
18
Language:
english
Pages:
3
DOI:
10.1023/a:1006651217517
Date:
April, 1999
File:
PDF, 94 KB
english, 1999
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