Exhaustive and Near-Exhaustive Memory Testing Techniques...

Journal of Electronic Testing 1997 / 06 Vol. 10; Iss. 3

Exhaustive and Near-Exhaustive Memory Testing Techniques and their BIST Implementations

Debaleena Das, Mark Karpovsky
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
10
Language:
english
Pages:
15
DOI:
10.1023/a:1008215624768
Date:
June, 1997
File:
PDF, 211 KB
english, 1997
Conversion to is in progress
Conversion to is failed