Mismatch Characterization of Submicron MOS Transistors

Mismatch Characterization of Submicron MOS Transistors

J. Bastos, M. Steyaert, A. Pergoot, W. Sansen
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Volume:
12
Pages:
12
DOI:
10.1023/a:1008256724276
Date:
February, 1997
File:
PDF, 667 KB
1997
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