ICCQ: A Test Method for Analogue VLSI Using Local Current...

Journal of Electronic Testing 1999 / 02 Vol. 14; Iss. 1-2

ICCQ: A Test Method for Analogue VLSI Using Local Current Sensors

Joop P.M. Van Lammeren
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Volume:
14
Language:
english
Pages:
6
DOI:
10.1023/a:1008341120580
Date:
February, 1999
File:
PDF, 221 KB
english, 1999
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