Combining Functional and Structural Approaches for Switched-Current Circuit Testing
M. Renovell, F. Azaïs, J-C. Bodin, Y. BertrandVolume:
16
Language:
english
Pages:
9
DOI:
10.1023/a:1008347516954
Date:
June, 2000
File:
PDF, 258 KB
english, 2000