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Electrical characterization of Si+and Si+/P+implanted N+P+In0.53Ga0.47As junctions
M. N. Blanco, E. Redondo, C. Leo´n, J. Santamaria, G. Gonza´lez-DiazVolume:
10
Language:
english
Pages:
4
DOI:
10.1023/a:1008918128149
Date:
July, 1999
File:
PDF, 104 KB
english, 1999