Reciprocal-space analysis of compositional modulation in...

Journal of Materials Science: Materials in Electronics 1999 / 05 Vol. 10; Iss. 3

Reciprocal-space analysis of compositional modulation in short-period superlattices using position-sensitive x-ray detection

S. R. Lee, J. Mirecki Millunchick, R. D. Twesten, D. M. Follstaedt, J. L. Reno, S. P. Ahrenkiel, A. G. Norman
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Volume:
10
Language:
english
Pages:
7
DOI:
10.1023/a:1008991827724
Date:
May, 1999
File:
PDF, 187 KB
english, 1999
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